| |
| 2006 | ||
|---|---|---|
| 2 | EE | Tze Wee Chen, Choshu Ito, William Loh, Robert W. Dutton: Post-breakdown leakage resistance and its dependence on device area. Microelectronics Reliability 46(9-11): 1612-1616 (2006) |
| 2001 | ||
| 1 | EE | Choshu Ito, Kaustav Banerjee, Robert W. Dutton: Analysis and Design of ESD Protection Circuits for High-Frequency/RF Applications. ISQED 2001: 117-122 |
| 1 | Kaustav Banerjee | [1] |
| 2 | Tze Wee Chen | [2] |
| 3 | Robert W. Dutton | [1] [2] |
| 4 | William Loh | [2] |