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Choshu Ito

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2006
2EETze Wee Chen, Choshu Ito, William Loh, Robert W. Dutton: Post-breakdown leakage resistance and its dependence on device area. Microelectronics Reliability 46(9-11): 1612-1616 (2006)
2001
1EEChoshu Ito, Kaustav Banerjee, Robert W. Dutton: Analysis and Design of ESD Protection Circuits for High-Frequency/RF Applications. ISQED 2001: 117-122

Coauthor Index

1Kaustav Banerjee [1]
2Tze Wee Chen [2]
3Robert W. Dutton [1] [2]
4William Loh [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)