Tze Wee Chen

2008
2	EE	Tze Wee Chen, Kyunglok Kim, Young Moon Kim, Subhasish Mitra: Gate-Oxide Early Life Failure Prediction. VTS 2008: 111-118
2006
1	EE	Tze Wee Chen, Choshu Ito, William Loh, Robert W. Dutton: Post-breakdown leakage resistance and its dependence on device area. Microelectronics Reliability 46(9-11): 1612-1616 (2006)

Coauthor Index

1	Robert W. Dutton	[1]
2	Choshu Ito	[1]
3	Kyunglok Kim	[2]
4	Young Moon Kim	[2]
5	William Loh	[1]
6	Subhasish Mitra	[2]

Colors in the list of coauthors