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| 2008 | ||
|---|---|---|
| 1 | EE | Yoshiaki Asao, Masayoshi Iwayama, Kenji Tsuchida, Akihiro Nitayama, Hiroaki Yoda, Hisanori Aikawa, Sumio Ikegawa, Tatsuya Kishi: A Statistical Model for Assessing the Fault Tolerance of Variable Switching Currents for a 1Gb Spin Transfer Torque Magnetoresistive Random Access Memory. DFT 2008: 507-515 |
| 1 | Hisanori Aikawa | [1] |
| 2 | Yoshiaki Asao | [1] |
| 3 | Sumio Ikegawa | [1] |
| 4 | Masayoshi Iwayama | [1] |
| 5 | Tatsuya Kishi | [1] |
| 6 | Akihiro Nitayama | [1] |
| 7 | Kenji Tsuchida | [1] |