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2008 | ||
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1 | EE | Yoshiaki Asao, Masayoshi Iwayama, Kenji Tsuchida, Akihiro Nitayama, Hiroaki Yoda, Hisanori Aikawa, Sumio Ikegawa, Tatsuya Kishi: A Statistical Model for Assessing the Fault Tolerance of Variable Switching Currents for a 1Gb Spin Transfer Torque Magnetoresistive Random Access Memory. DFT 2008: 507-515 |
1 | Hisanori Aikawa | [1] |
2 | Yoshiaki Asao | [1] |
3 | Sumio Ikegawa | [1] |
4 | Tatsuya Kishi | [1] |
5 | Akihiro Nitayama | [1] |
6 | Kenji Tsuchida | [1] |
7 | Hiroaki Yoda | [1] |