| 1999 |
|---|
| 7 | EE | Krishnaiyan Thulasiraman,
Anindya Das,
Kaiyuan Huang,
Vinod K. Agarwal:
Correct diagnosis of almost all faulty units in a multiprocessor system.
ISCAS (6) 1999: 161-164 |
| 1998 |
|---|
| 6 | EE | Kaiyuan Huang,
Vinod K. Agarwal,
Krishnaiyan Thulasiraman:
Diagnosis of clustered faults and wafer testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 17(2): 136-148 (1998) |
| 5 | EE | Krishnaiyan Thulasiraman,
Anindya Das,
Kaiyuan Huang,
Vinod K. Agarwal:
Correct Diagnosis of Almost All Faulty Units in a Multiprocessor System.
Journal of Circuits, Systems, and Computers 8(4): 473-481 (1998) |
| 1995 |
|---|
| 4 | EE | Kaiyuan Huang,
Vinod K. Agarwal,
Laurence E. LaForge,
Krishnaiyan Thulasiraman:
A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing.
IEEE Trans. Parallel Distrib. Syst. 6(4): 363-372 (1995) |
| 1994 |
|---|
| 3 | | Laurence E. LaForge,
Kaiyuan Huang,
Vinod K. Agarwal:
Almost Sure Diagnosis of Almost Every Good Element.
IEEE Trans. Computers 43(3): 295-305 (1994) |
| 1992 |
|---|
| 2 | | Kaiyuan Huang,
Vinod K. Agarwal,
Laurence E. LaForge:
Wafer Testing with Pairwise Comparisons.
FTCS 1992: 374-383 |
| 1986 |
|---|
| 1 | | Kaiyuan Huang,
Tinghuai Chen:
On the Diagnosis of System Faults with Propagation.
IEEE Trans. Computers 35(12): 1082-1086 (1986) |
