| |
| 2008 | ||
|---|---|---|
| 3 | EE | Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer: An Error Rate Based Test Methodology to Support Error-Tolerance. IEEE Transactions on Reliability 57(1): 204-214 (2008) |
| 2007 | ||
| 2 | EE | Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer: Reduction of detected acceptable faults for yield improvement via error-tolerance. DATE 2007: 1599-1604 |
| 2006 | ||
| 1 | EE | Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer: An Error-Oriented Test Methodology to Improve Yield with Error-Tolerance. VTS 2006: 130-135 |
| 1 | Melvin A. Breuer | [1] [2] [3] |
| 2 | Kuen-Jong Lee | [1] [2] [3] |