Damien Giot
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2006
1
EE
Tino Heijmen
, Damien Giot,
Philippe Roche
: Factors That Impact the Critical Charge of Memory Elements.
IOLTS 2006
: 57-62
Coauthor
Index
1
Tino Heijmen
[
1
]
2
Philippe Roche
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
