| |
| 2006 | ||
|---|---|---|
| 2 | EE | Tino Heijmen, André Nieuwland: Soft-Error Rate Testing of Deep-Submicron Integrated Circuits. European Test Symposium 2006: 247-252 |
| 2001 | ||
| 1 | Om Prakash Gangwal, André Nieuwland, Paul E. R. Lippens: A scalable and flexible data synchronization scheme for embedded HW-SW shared-memory systems. ISSS 2001: 1-6 | |
| 1 | Om Prakash Gangwal | [1] |
| 2 | Tino Heijmen | [2] |
| 3 | Paul E. R. Lippens | [1] |