| |
| 1995 | ||
|---|---|---|
| 3 | EE | Oliver F. Haberl, Thomas Kropf: HIST: A hierarchical self test methodology for chips, boards, and systems. J. Electronic Testing 6(1): 85-106 (1995) |
| 1994 | ||
| 2 | Oliver F. Haberl, Thomas Kropf: Self Testable Boards with Standard IEEE 1149.5 Module Test and Maintenance (MTM) Bus Interface. EDAC-ETC-EUROASIC 1994: 220-225 | |
| 1992 | ||
| 1 | Oliver F. Haberl, Thomas Kropf: HIST: A Methodology for the Automatic Insertion of a Hierarchical Self Test. ITC 1992: 732-741 | |
| 1 | Thomas Kropf | [1] [2] [3] |