| 2008 |
|---|
| 11 | EE | Amit Kumar Gupta,
Peter Lendermann,
Appa Iyer Sivakumar,
John Priyadi:
Simulation analysis of cluster tool operations in wafer fabrication.
Winter Simulation Conference 2008: 2141-2147 |
| 10 | EE | Amit Kumar Gupta,
Saeid Nooshabadi,
David S. Taubman:
Efficient Interfacing of DWT and EBCOT in JPEG2000.
IEEE Trans. Circuits Syst. Video Techn. 18(5): 687-693 (2008) |
| 2007 |
|---|
| 9 | EE | Amit Kumar Gupta,
Saeid Nooshabadi,
David Taubman:
Efficient Data Transfer Techniques and VLSI architecture for DWT-Block Coder Integration of JPEG2000 Encoder.
ISCAS 2007: 1365-1368 |
| 8 | EE | Amit Kumar Gupta,
Saeid Nooshabadi:
Novel Distortion Estimation Technique for Hardware-Based JPEG2000 Encoder System.
IEEE Trans. Circuits Syst. Video Techn. 17(7): 918-923 (2007) |
| 2006 |
|---|
| 7 | EE | Amit Kumar Gupta,
Appa Iyer Sivakumar:
Pareto control in multi-objective dynamic scheduling of a stepper machine in semiconductor wafer fabrication.
Winter Simulation Conference 2006: 1749-1756 |
| 6 | EE | Amit Kumar Gupta,
Saeid Nooshabadi,
David Taubman,
Michael Dyer:
Realizing Low-Cost High-Throughput General-Purpose Block Encoder for JPEG2000.
IEEE Trans. Circuits Syst. Video Techn. 16(7): 843-858 (2006) |
| 2005 |
|---|
| 5 | EE | Amit Kumar Gupta,
Saeid Nooshabadi,
David S. Taubman:
Efficient VLSI architecture for buffer used in EBCOT of JPEG2000 encoder.
ISCAS (5) 2005: 4361-4364 |
| 4 | EE | Amit Kumar Gupta,
Saeid Nooshabadi,
David S. Taubman:
Optimal 2 sub-bank memory architecture for bit plane coder of JPEG2000.
ISCAS (5) 2005: 4373-4376 |
| 3 | EE | Amit Kumar Gupta,
Saeid Nooshabadi,
David Taubman:
Concurrent Symbol Processing Capable VLSI Architecture for Bit Plane Coder of JPEG2000.
IEICE Transactions 88-D(8): 1878-1884 (2005) |
| 2004 |
|---|
| 2 | EE | Viswanath Kumar Ganesan,
Amit Kumar Gupta,
Appa Iyer Sivakumar:
Bi-objective schedule control of batch processes in semiconductor manufacturing.
RAM 2004: 1077-1082 |
| 1 | EE | Amit Kumar Gupta,
Appa Iyer Sivakumar,
Viswanath Kumar Ganesan:
Look ahead batching to minimize earliness/tardiness measures in batch processes.
RAM 2004: 1101-1106 |
