N. Guo

2006
2	EE	H. C. Yeo, N. Guo, H. Du, W. M. Huang, X. M. Jian: Characterisation of IC packaging interfaces and loading effects. Microelectronics Reliability 46(9-11): 1892-1897 (2006)
2001
1	EE	D. Zhou, Wei Li, W. Cai, N. Guo: An efficient balanced truncation realization algorithm for interconnect model order reduction. ISCAS (5) 2001: 383-386

Coauthor Index

1	W. Cai	[1]
2	H. Du	[2]
3	W. M. Huang	[2]
4	X. M. Jian	[2]
5	Wei Li	[1]
6	H. C. Yeo	[2]
7	D. Zhou	[1]

Colors in the list of coauthors