| |
| 2002 | ||
|---|---|---|
| 2 | EE | P. Galy, V. Berland, B. Foucher, A. Guilhaume, J. P. Chante, S. Bardy, F. Blanc: Experimental and 3D simulation correlation of a gg-nMOS transistor under high current pulse. Microelectronics Reliability 42(9-11): 1299-1302 (2002) |
| 2001 | ||
| 1 | A. Guilhaume, P. Galy, J. P. Chante, B. Foucher, F. Blanc: Simulation and experimental comparison of GGNMOS and LVTSCR protection cells under ElectroStatic Discharges. Microelectronics Reliability 41(9-10): 1433-1437 (2001) | |
| 1 | S. Bardy | [2] |
| 2 | V. Berland | [2] |
| 3 | F. Blanc | [1] [2] |
| 4 | J. P. Chante | [1] [2] |
| 5 | B. Foucher | [1] [2] |
| 6 | P. Galy | [1] [2] |