P. Galy

2002
2	EE	P. Galy, V. Berland, B. Foucher, A. Guilhaume, J. P. Chante, S. Bardy, F. Blanc: Experimental and 3D simulation correlation of a gg-nMOS transistor under high current pulse. Microelectronics Reliability 42(9-11): 1299-1302 (2002)
2001
1		A. Guilhaume, P. Galy, J. P. Chante, B. Foucher, F. Blanc: Simulation and experimental comparison of GGNMOS and LVTSCR protection cells under ElectroStatic Discharges. Microelectronics Reliability 41(9-10): 1433-1437 (2001)

Coauthor Index

1	S. Bardy	[2]
2	V. Berland	[2]
3	F. Blanc	[1] [2]
4	J. P. Chante	[1] [2]
5	B. Foucher	[1] [2]
6	A. Guilhaume	[1] [2]