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2006 | ||
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2 | EE | Cher Ming Tan, Zhenghao Gan, Tai Chong Chai: Feasibility study of the application of voltage contrast to printed circuit board. Microelectronics Reliability 46(5-6): 939-948 (2006) |
2005 | ||
1 | EE | Cher Ming Tan, Zhenghao Gan, Wai Fung Ho, Sam Chen, Robert Liu: Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications. Microelectronics Reliability 45(1): 179-184 (2005) |
1 | Tai Chong Chai | [2] |
2 | Sam Chen | [1] |
3 | Wai Fung Ho | [1] |
4 | Robert Liu | [1] |
5 | Cher Ming Tan | [1] [2] |