| |
| 2006 | ||
|---|---|---|
| 2 | EE | Cher Ming Tan, Zhenghao Gan, Tai Chong Chai: Feasibility study of the application of voltage contrast to printed circuit board. Microelectronics Reliability 46(5-6): 939-948 (2006) |
| 2005 | ||
| 1 | EE | Cher Ming Tan, Kim Peng Lim, Tai Chong Chai, Guat Cheng Lim: Non-destructive identification of open circuit in wiring on organic substrate with high wiring density covered with solder resist. Microelectronics Reliability 45(9-11): 1572-1575 (2005) |
| 1 | Zhenghao Gan | [2] |
| 2 | Guat Cheng Lim | [1] |
| 3 | Kim Peng Lim | [1] |
| 4 | Cher Ming Tan | [1] [2] |