Ken Filliter

2002
2	EE	Magnus Eckersand, Fredrik Franzon, Ken Filliter: Using At-Speed BIST to Test LVDS Serializer/Deserializer Function. J. Electronic Testing 18(2): 171-177 (2002)
2001
1		Stephen K. Sunter, Ken Filliter, Joe Woo, Pat McHugh: A general purpose 1149.4 IC with HF analog test capabilities. ITC 2001: 38-45

Coauthor Index

1	Magnus Eckersand	[2]
2	Fredrik Franzon	[2]
3	Pat McHugh	[1]
4	Stephen K. Sunter	[1]
5	Joe Woo	[1]

Colors in the list of coauthors