Magnus Eckersand
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2002
1
EE
Magnus Eckersand,
Fredrik Franzon
,
Ken Filliter
: Using At-Speed BIST to Test LVDS Serializer/Deserializer Function.
J. Electronic Testing 18
(2): 171-177 (2002)
Coauthor
Index
1
Ken Filliter
[
1
]
2
Fredrik Franzon
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
