| |
| 1997 | ||
|---|---|---|
| 1 | EE | Giacomo Buonanno, Fabrizio Ferrandi, L. Ferrandi, Franco Fummi, Donatella Sciuto: How an "Evolving" Fault Model Improves the Behavioral Test Generation. Great Lakes Symposium on VLSI 1997: 124- |
| 1 | Giacomo Buonanno | [1] |
| 2 | Fabrizio Ferrandi | [1] |
| 3 | Franco Fummi | [1] |
| 4 | Donatella Sciuto | [1] |