| |
| 2001 | ||
|---|---|---|
| 2 | Stephen K. Sunter, Charles McDonald, Givargis Danialy: Contactless digital testing of IC pin leakage currents. ITC 2001: 204-210 | |
| 2000 | ||
| 1 | Martin Bell, Givargis Danialy, Michael C. Howells, Stephen Pateras: Bridging the gap between embedded test and ATE. ITC 2000: 55-63 | |
| 1 | Martin Bell | [1] |
| 2 | Michael C. Howells | [1] |
| 3 | Charles McDonald | [2] |
| 4 | Stephen Pateras | [1] |
| 5 | Stephen K. Sunter | [2] |