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Edmond S. Cooley

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1999
4EER. Dean Adams, Edmond S. Cooley: The Limits of Digital Testing for Dynamic Circuits. VTS 1999: 28-33
1998
3EER. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: Quad DCVS dynamic logic fault modeling and testing. ITC 1998: 356-362
1997
2 R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal. ITC 1997: 217-225
1986
1 Edmond S. Cooley, John L. Cuadrado: ISSD: An Intelligent Support System for DSP Design. COMPCON 1986: 121-125

Coauthor Index

1R. Dean Adams [2] [3] [4]
2John L. Cuadrado [1]
3Patrick R. Hansen [2] [3]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)