1999 | ||
---|---|---|
4 | EE | R. Dean Adams, Edmond S. Cooley: The Limits of Digital Testing for Dynamic Circuits. VTS 1999: 28-33 |
1998 | ||
3 | EE | R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: Quad DCVS dynamic logic fault modeling and testing. ITC 1998: 356-362 |
1997 | ||
2 | R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal. ITC 1997: 217-225 | |
1986 | ||
1 | Edmond S. Cooley, John L. Cuadrado: ISSD: An Intelligent Support System for DSP Design. COMPCON 1986: 121-125 |
1 | R. Dean Adams | [2] [3] [4] |
2 | John L. Cuadrado | [1] |
3 | Patrick R. Hansen | [2] [3] |