Patrick R. Hansen

1998
2	EE	R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: Quad DCVS dynamic logic fault modeling and testing. ITC 1998: 356-362
1997
1		R. Dean Adams, Edmond S. Cooley, Patrick R. Hansen: A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal. ITC 1997: 217-225

Coauthor Index

1	R. Dean Adams	[1] [2]
2	Edmond S. Cooley	[1] [2]