2005 |
2 | EE | Fu-Chien Chiu,
Shun-An Lin,
Joseph Ya-min Lee:
Electrical properties of metal-HfO2-silicon system measured from metal-insulator-semiconductor capacitors and metal-insulator-semiconductor field-effect transistors using HfO2 gate dielectric.
Microelectronics Reliability 45(5-6): 961-964 (2005) |
2004 |
1 | EE | Chih-Yao Huang,
Wei-Fang Chen,
Song-Yu Chuan,
Fu-Chien Chiu,
Jeng-Chou Tseng,
I-Cheng Lin,
Chuan-Jane Chao,
Len-Yi Leu,
Ming-Dou Ker:
Design optimization of ESD protection and latchup prevention for a serial I/O IC.
Microelectronics Reliability 44(2): 213-221 (2004) |