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| 2004 | ||
|---|---|---|
| 2 | EE | Chih-Yao Huang, Wei-Fang Chen, Song-Yu Chuan, Fu-Chien Chiu, Jeng-Chou Tseng, I-Cheng Lin, Chuan-Jane Chao, Len-Yi Leu, Ming-Dou Ker: Design optimization of ESD protection and latchup prevention for a serial I/O IC. Microelectronics Reliability 44(2): 213-221 (2004) |
| 2003 | ||
| 1 | EE | I-Cheng Lin, Chih-Yao Huang, Chuan-Jane Chao, Ming-Dou Ker: Anomalous latchup failure induced by on-chip ESD protection circuit in a high-voltage CMOS IC product. Microelectronics Reliability 43(8): 1295-1301 (2003) |
| 1 | Wei-Fang Chen | [2] |
| 2 | Fu-Chien Chiu | [2] |
| 3 | Song-Yu Chuan | [2] |
| 4 | Chih-Yao Huang | [1] [2] |
| 5 | Ming-Dou Ker | [1] [2] |
| 6 | Len-Yi Leu | [2] |
| 7 | I-Cheng Lin | [1] [2] |
| 8 | Jeng-Chou Tseng | [2] |