K.-T. Cheng

1999
2	EE	Zao Yang, K.-T. Cheng, K. L. Tai: A New Bare Die Test Methodology. VTS 1999: 290-295
1997
1	EE	K.-T. Cheng, Kewal K. Saluja, Hans-Joachim Wunderlich: Guest Editorial. J. Electronic Testing 11(1): 7-8 (1997)

Coauthor Index

1	Kewal K. Saluja	[1]
2	K. L. Tai	[2]
3	Hans-Joachim Wunderlich	[1]
4	Zao Yang	[2]

Colors in the list of coauthors