| |
| 2000 | ||
|---|---|---|
| 2 | EE | Shih-Chieh Chang, Wen-Ben Jone, Shi-Sen Chang: TAIR: testability analysis by implication reasoning. IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 152-160 (2000) |
| 1998 | ||
| 1 | EE | Shih-Chieh Chang, Shi-Sen Chang, Wen-Ben Jone, Chien-Chung Tsai: A novel combinational testability analysis by considering signal correlation. ITC 1998: 658-667 |
| 1 | Shih-Chieh Chang | [1] [2] |
| 2 | Wen-Ben Jone | [1] [2] |
| 3 | Chien-Chung Tsai | [1] |