2006 | ||
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1 | EE | Chih-Tang Peng, Chia-Tai Kuo, Kuo-Ning Chiang, Terry Ku, Kenny Chang: Experimental characterization and mechanical behavior analysis of intermetallic compounds of Sn-3.5Ag lead-free solder bump with Ti/Cu/Ni UBM on copper chip. Microelectronics Reliability 46(2-4): 523-534 (2006) |
1 | Kuo-Ning Chiang | [1] |
2 | Terry Ku | [1] |
3 | Chia-Tai Kuo | [1] |
4 | Chih-Tang Peng | [1] |