| |
| 2005 | ||
|---|---|---|
| 2 | EE | Tomasz Brozek: Editorial. Microelectronics Reliability 45(1): 1-2 (2005) |
| 2002 | ||
| 1 | EE | Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li: Series resistance degradation due to NBTI in PMOSFET. Microelectronics Reliability 42(9-11): 1433-1438 (2002) |
| 1 | Viktor Kol'dyaev | [1] |
| 2 | Mahesh S. Krishnan | [1] |
| 3 | Xiaolei Li | [1] |
| 4 | Koji Miyamoto | [1] |
| 5 | Eiji Morifoji | [1] |