Koji Miyamoto

2002
2	EE	Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li: Series resistance degradation due to NBTI in PMOSFET. Microelectronics Reliability 42(9-11): 1433-1438 (2002)
2000
1	EE	Shaoying Liu, Tetsuo Fukuzaki, Koji Miyamoto: A GUI and testing tool for SOFL. APSEC 2000: 421-

Coauthor Index

1	Tomasz Brozek	[2]
2	Tetsuo Fukuzaki	[1]
3	Viktor Kol'dyaev	[2]
4	Mahesh S. Krishnan	[2]
5	Xiaolei Li	[2]
6	Shaoying Liu	[1]
7	Eiji Morifoji	[2]

Colors in the list of coauthors