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Mahesh S. Krishnan

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2002
1EEMahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li: Series resistance degradation due to NBTI in PMOSFET. Microelectronics Reliability 42(9-11): 1433-1438 (2002)

Coauthor Index

1Tomasz Brozek [1]
2Viktor Kol'dyaev [1]
3Xiaolei Li [1]
4Koji Miyamoto [1]
5Eiji Morifoji [1]

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