David R. Akeson

1998
2	EE	Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson: Testability access of the high speed test features in the Alpha 21264 microprocessor. ITC 1998: 487-
1	EE	Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill: A highly testable and diagnosable fabrication process test chip. ITC 1998: 853-861

Coauthor Index

1	Dilip K. Bhavsar	[1] [2]
2	William J. Bowhill	[1]
3	Ugonna Echeruo	[1]
4	Michael K. Gowan	[2]
5	Daniel B. Jackson	[2]