Ugonna Echeruo
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1998
1
EE
Dilip K. Bhavsar
, Ugonna Echeruo,
David R. Akeson
,
William J. Bowhill
: A highly testable and diagnosable fabrication process test chip.
ITC 1998
: 853-861
Coauthor
Index
1
David R. Akeson
[
1
]
2
Dilip K. Bhavsar
[
1
]
3
William J. Bowhill
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
