S. Bohidar
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2003
1
EE
Hui-Yuan Song
, S. Bohidar,
R. Iris Bahar
,
Joel Grodstein
: Symbolic Failure Analysis of Custom Circuits due to Excessive Leakage Current.
ICCD 2003
: 70-75
Coauthor
Index
1
R. Iris Bahar
[
1
]
2
Joel Grodstein
[
1
]
3
Hui-Yuan Song
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
