| 2005 |
|---|
| 3 | EE | Vesselin K. Vassilev,
V. A. Vashchenko,
Ph. Jansen,
Guido Groeseneken,
M. ter Beek:
ESD circuit model based protection network optimisation for extended-voltage NMOS drivers.
Microelectronics Reliability 45(9-11): 1430-1435 (2005) |
| 2003 |
|---|
| 2 | EE | V. A. Vashchenko,
A. Concannon,
M. ter Beek,
P. Hopper:
LVTSCR structures for latch-up free ESD protection of BiCMOS RF circuits.
Microelectronics Reliability 43(1): 61-69 (2003) |
| 1 | EE | V. A. Vashchenko,
A. Concannon,
M. ter Beek,
P. Hopper:
Quasi-3D simulation approach for comparative evaluation of triggering ESD protection structures.
Microelectronics Reliability 43(3): 427-437 (2003) |
