| |
| 2003 | ||
|---|---|---|
| 2 | EE | V. A. Vashchenko, A. Concannon, M. ter Beek, P. Hopper: LVTSCR structures for latch-up free ESD protection of BiCMOS RF circuits. Microelectronics Reliability 43(1): 61-69 (2003) |
| 1 | EE | V. A. Vashchenko, A. Concannon, M. ter Beek, P. Hopper: Quasi-3D simulation approach for comparative evaluation of triggering ESD protection structures. Microelectronics Reliability 43(3): 427-437 (2003) |
| 1 | M. ter Beek | [1] [2] |
| 2 | P. Hopper | [1] [2] |
| 3 | V. A. Vashchenko | [1] [2] |