1998 |
4 | EE | Mokhtar Hirech,
James Beausang,
Xinli Gu:
A new approach to scan chain reordering using physical design information.
ITC 1998: 348- |
1997 |
3 | | Harbinder Singh,
James Beausang,
Girish Patankar:
A Symbolic Simulation-Based ANSI/IEEE Std 1149.1 Compliance Checker and BSDL Generator.
ITC 1997: 256-264 |
1996 |
2 | | James Beausang,
Chris Ellingham,
Markus Robinson:
Integrating Scan into Hierarchical Synthesis Methodologies.
ITC 1996: 751-756 |
1988 |
1 | | M. M. Pradhan,
E. J. O'Brien,
S. L. Lam,
James Beausang:
Circular BIST with Partial Scan.
ITC 1988: 719-729 |