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Yongchan Ban

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2008
2EEMinsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan: ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction. DAC 2008: 504-509
1EEMinsik Cho, Yongchan Ban, David Z. Pan: Double patterning technology friendly detailed routing. ICCAD 2008: 506-511

Coauthor Index

1Minsik Cho [1] [2]
2David Z. Pan (David Zhigang Pan) [1] [2]
3Kun Yuan [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)