| |
| 2008 | ||
|---|---|---|
| 2 | EE | Minsik Cho, Kun Yuan, Yongchan Ban, David Z. Pan: ELIAD: efficient lithography aware detailed router with compact post-OPC printability prediction. DAC 2008: 504-509 |
| 1 | EE | Minsik Cho, Yongchan Ban, David Z. Pan: Double patterning technology friendly detailed routing. ICCAD 2008: 506-511 |
| 1 | Minsik Cho | [1] [2] |
| 2 | David Z. Pan (David Zhigang Pan) | [1] [2] |
| 3 | Kun Yuan | [2] |