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2005 | ||
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2 | EE | José Pineda de Gyvez, Guido Gronthoud, Rashid Amine: Multi-VDD Testing for Analog Circuits. J. Electronic Testing 21(3): 311-322 (2005) |
2003 | ||
1 | EE | José Pineda de Gyvez, Guido Gronthoud, Rashid Amine: VDD Ramp Testing for RF Circuits. ITC 2003: 651-658 |
1 | Guido Gronthoud | [1] [2] |
2 | José Pineda de Gyvez | [1] [2] |