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Rashid Amine

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2005
2EEJosé Pineda de Gyvez, Guido Gronthoud, Rashid Amine: Multi-VDD Testing for Analog Circuits. J. Electronic Testing 21(3): 311-322 (2005)
2003
1EEJosé Pineda de Gyvez, Guido Gronthoud, Rashid Amine: VDD Ramp Testing for RF Circuits. ITC 2003: 651-658

Coauthor Index

1Guido Gronthoud [1] [2]
2José Pineda de Gyvez [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)