| |
| 2008 | ||
|---|---|---|
| 4 | EE | Mohamed H. Abu-Rahma, Kinshuk Chowdhury, Joseph Wang, Zhiqin Chen, Sei Seung Yoon, Mohab Anis: A methodology for statistical estimation of read access yield in SRAMs. DAC 2008: 205-210 |
| 3 | EE | Mohamed H. Abu-Rahma, Mohab Anis: A Statistical Design-Oriented Delay Variation Model Accounting for Within-Die Variations. IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 1983-1995 (2008) |
| 2007 | ||
| 2 | EE | Mohamed H. Abu-Rahma, Mohab Anis: Variability in VLSI Circuits: Sources and Design Considerations. ISCAS 2007: 3215-3218 |
| 2005 | ||
| 1 | EE | Mohab Anis, Mohamed H. Abu-Rahma: Leakage Current Variability in Nanometer Technologies, invited. IWSOC 2005: 60-63 |
| 1 | Mohab Anis | [1] [2] [3] [4] |
| 2 | Zhiqin Chen | [4] |
| 3 | Kinshuk Chowdhury | [4] |
| 4 | Joseph Wang | [4] |
| 5 | Sei Seung Yoon | [4] |