3. A-MOST 2007:
London,
UK
 Proceedings of the 3rd Workshop on Advances in Model Based Testing, A-MOST 2007, co-located with the ISSTA 2007 International Symposium on Software Testing and Analysis, London, United Kingdom, July 9-12.
 ACM 2007, ISBN 978-1-59593-850-3 BibTeX
 
- Nicolas Kicillof, Wolfgang Grieskamp, Nikolai Tillmann, Víctor A. Braberman:
Achieving both model and code coverage with automated gray-box testing.
1-11
Electronic Edition (ACM DL) BibTeX
 - Pierre-Alain Masson, Jacques Julliand, Jean-Chritophe Plessis, Eddie Jaffuel, Georges Debois:
Automatic generation of model based tests for a class of security properties.
12-22
Electronic Edition (ACM DL) BibTeX
 - Sebastian Benz:
Combining test case generation for component and integration testing.
23-33
Electronic Edition (ACM DL) BibTeX
 - Bogdan Korel, George Koutsogiannakis, Luay Ho Tahat:
Model-based test prioritization heuristic methods and their evaluation.
34-43
Electronic Edition (ACM DL) BibTeX
 - Qurat-ul-ann Farooq, Muhammad Zohaib Z. Iqbal, Zafar I. Malik, Aamer Nadeem:
An approach for selective state machine based regression testing.
44-52
Electronic Edition (ACM DL) BibTeX
 - Yanping Chen, Robert L. Probert, Hasan Ural:
Model-based regression test suite generation using dependence analysis.
54-62
Electronic Edition (ACM DL) BibTeX
 - Gordon Fraser, Franz Wotawa:
Using LTL rewriting to improve the performance of model-checker based test-case generation.
64-74
Electronic Edition (ACM DL) BibTeX
 - Duminda Wijesekera, Paul Ammann, Lingya Sun, Gordon Fraser:
Relating counterexamples to test cases in CTL model checking specifications.
75-84
Electronic Edition (ACM DL) BibTeX
 - Manoranjan Satpathy, S. Ramesh:
Test case generation from formal models through abstraction refinement and model checking.
85-94
Electronic Edition (ACM DL) BibTeX
 - Fabrice Bouquet, C. Grandpierre, Bruno Legeard, Fabien Peureux, Nicolas Vacelet, Mark Utting:
A subset of precise UML for model-based testing.
95-104
Electronic Edition (ACM DL) BibTeX
 - Leila Naslavsky, Hadar Ziv, Debra J. Richardson:
Towards traceability of model-based testing artifacts.
105-114
Electronic Edition (ACM DL) BibTeX
 - Bernhard K. Aichernig, Martin Weiglhofer, Bernhard Peischl, Franz Wotawa:
Test purpose generation in an industrial application.
115-125
Electronic Edition (ACM DL) BibTeX
 
Copyright © Sat May 16 22:57:45 2009
 by Michael Ley (ley@uni-trier.de)