| 2007 |
|---|
| 5 | EE | Pierre-Alain Masson,
Jacques Julliand,
Jean-Chritophe Plessis,
Eddie Jaffuel,
Georges Debois:
Automatic generation of model based tests for a class of security properties.
A-MOST 2007: 12-22 |
| 4 | EE | Eddie Jaffuel:
Using B Machines for Model-Based Testing of Smartcard Software.
B 2007: 2 |
| 3 | EE | Eddie Jaffuel,
Bruno Legeard:
LEIRIOS Test Generator: Automated Test Generation from B Models.
B 2007: 277-280 |
| 2005 |
|---|
| 2 | EE | Fabrice Bouquet,
Eddie Jaffuel,
Bruno Legeard,
Fabien Peureux,
Mark Utting:
Requirements traceability in automated test generation: application to smart card software validation.
A-MOST 2005 |
| 1 | EE | Fabrice Bouquet,
Eddie Jaffuel,
Bruno Legeard,
Fabien Peureux,
Mark Utting:
Requirements traceability in automated test generation: application to smart card software validation.
ACM SIGSOFT Software Engineering Notes 30(4): 1-7 (2005) |
