Software Testing, Verification & Reliability (STVR), Volume 18

Volume 18, Number 1, March 2008

• Jeff Offutt:
  Editorial: The journal impact factor. 1-3
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• Sara Gradara, Antonella Santone, Gigliola Vaglini, Maria Luisa Villani:
  Modular formal verification of specifications of concurrent systems. 5-28
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• Stefan Blom, Thomas Deiß, Natalia Ioustinova, Ari Kontio, Jaco van de Pol, Axel Rennoch, Natalia Sidorova:
  Simulated time for host-based testing with TTCN-3. 29-49
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• Lihua Duan, Jessica Chen:
  Error-preserving reductions on communication protocols. 51-68
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Volume 18, Number 2, June 2008

• Mark Harman, Zheng Li, Phil McMinn:
  Editorial: Testing practice and research. 69-70
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• Helmut Neukirchen, Benjamin Zeiss, Jens Grabowski, Paul Baker, Dominic Evans:
  Quality assurance for TTCN-3 test specifications. 71-97
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• Neil Walkinshaw, Kirill Bogdanov, Shaukat Ali, Mike Holcombe:
  Automated discovery of state transitions and their functions in source code. 99-121
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Volume 18, Number 3, September 2008

• Jeff Offutt:
  Editorial: Science Fiction and Fantasy. 123-124
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• Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun, James Lawrence:
  IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing. 125-148
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• Garrett Kaminski, Gregory Williams, Paul Ammann:
  Reconciling perspectives of software logic testing. 149-188
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• Gerald Lüttgen:
  Modeling and verification using UML Statecharts. By Doron Drusinsky. Published by Newnes Publishers, 2006, ISBN 0-7506-7617-5, 306 pages. 189-190
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Volume 18, Number 4, December 2008

• Jeff Offutt:
  Editorial: Software testing is an elephant. 191-192
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• Supaporn Kansomkeat, Wanchai Rivepiboon:
  An analysis technique to increase testability of object-oriented components. 193-219
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• Jyh-Wen Ho, Chih-Chiang Fang, Yeu-Shiang Huang:
  The determination of optimal software release times at different confidence levels with consideration of learning effects. 221-249
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• Richard F. Paige:
  Model-driven software development. By Thomas Stahl and Markus Volter. Published by John Wiley & Sons, New York, 2006. ISBN: 0470025700. 251-252
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