| 2008 |
|---|
| 7 | EE | Martin Botteck,
Thomas Deiß:
Introduction of TTCN-3 into the product development process: considerations from an electronic devices developer point of view.
STTT 10(4): 285-289 (2008) |
| 6 | EE | Thomas Deiß:
Refactoring and converting a TTCN-2 test suite.
STTT 10(4): 347-352 (2008) |
| 5 | EE | Stefan Blom,
Thomas Deiß,
Natalia Ioustinova,
Ari Kontio,
Jaco van de Pol,
Axel Rennoch,
Natalia Sidorova:
Simulated time for host-based testing with TTCN-3.
Softw. Test., Verif. Reliab. 18(1): 29-49 (2008) |
| 2006 |
|---|
| 4 | EE | Stefan Blom,
Thomas Deiß,
Natalia Ioustinova,
Ari Kontio,
Jaco van de Pol,
Axel Rennoch,
Natalia Sidorova:
TTCN-3 for Distributed Testing Embedded Software.
Ershov Memorial Conference 2006: 98-111 |
| 3 | EE | Thomas Deiß,
Andreas Johan Nyberg,
Stephan Schulz,
Risto Teittinen,
Colin Willcock:
Industrial Deployment of the TTCN-3 Testing Technology.
IEEE Software 23(4): 48-54 (2006) |
| 1999 |
|---|
| 2 | | Thomas Deiß:
An Approach to the Combination of Formal Description Techniques: Statecharts and TLA.
IFM 1999: 231-250 |
| 1992 |
|---|
| 1 | | Thomas Deiß:
Conditional Seme-Thue Systems for Presenting Monoids.
STACS 1992: 557-565 |
