Volume 72,
Numbers 1-2,
August 2008
- Nader H. Bshouty, Claudio Gentile:
Guest Editors' Introduction: Special issue on Learning Theory (COLT-2007).
1-4
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- Sudipto Guha, Piotr Indyk, Andrew McGregor:
Sketching information divergences.
5-19
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- Eyal Even-Dar, Michael Kearns, Yishay Mansour, Jennifer Wortman:
Regret to the best vs. regret to the average.
21-37
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- Arnak S. Dalalyan, Alexandre B. Tsybakov:
Aggregation by exponential weighting, sharp PAC-Bayesian bounds and sparsity.
39-61
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- John Case, Samuel E. Moelius:
U-shaped, iterative, and iterative-with-counter learning.
63-88
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- Maria-Florina Balcan, Avrim Blum, Nathan Srebro:
A theory of learning with similarity functions.
89-112
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- Dana Angluin, James Aspnes, Jiang Chen, Lev Reyzin:
Learning large-alphabet and analog circuits with value injection queries.
113-138
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- Maria-Florina Balcan, Nikhil Bansal, Alina Beygelzimer, Don Coppersmith, John Langford, Gregory B. Sorkin:
Robust reductions from ranking to classification.
139-153
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Volume 72,
Number 3,
September 2008
- Walter Daelemans, Bart Goethals, Katharina Morik:
Guest Editors' introduction: special issue of selected papers from ECML PKDD 2008.
155-156
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- Christos Dimitrakakis, Michail G. Lagoudakis:
Rollout sampling approximate policy iteration.
157-171
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- Ran El-Yaniv, Dmitry Pechyony, Vladimir Vapnik:
Large margin vs. large volume in transductive learning.
173-188
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- Ankur Jain, Daniel Nikovski:
Incremental exemplar learning schemes for classification on embedded devices.
189-203
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- Dvijotham Krishnamurthy, Soumen Chakrabarti, Subhasis Chaudhuri:
New closed-form bounds on the partition function.
205-229
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- Heng Luo, Changyong Niu, Ruimin Shen, Carsten Ullrich:
A collaborative filtering framework based on both local user similarity and global user similarity.
231-245
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- Stijn Vanderlooy, Eyke Hüllermeier:
A critical analysis of variants of the AUC.
247-262
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- Markus Weimer, Alexandros Karatzoglou, Alex J. Smola:
Improving maximum margin matrix factorization.
263-276
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Copyright © Sun May 17 00:13:40 2009
by Michael Ley (ley@uni-trier.de)