| |
| 1995 | ||
|---|---|---|
| 2 | EE | Abdel-Fattah Yousif, Jun Gu: Concurrent automatic test pattern generation algorithm for combinational circuits. ICCD 1995: 286-291 |
| 1993 | ||
| 1 | Abdel-Fattah Yousif, Jun Gu: An Efficient Global Search Algorithm for Test Generation. ISCAS 1993: 1499-1502 | |
| 1 | Jun Gu | [1] [2] |