Yuki Yoshikaw
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2005
1
EE
Yuki Yoshikaw,
Satoshi Ohtake
,
Michiko Inoue
,
Hideo Fujiwara
: Design for Testability Based on Single-Port-Change Delay Testing for Data Paths.
Asian Test Symposium 2005
: 254-259
Coauthor
Index
1
Hideo Fujiwara
[
1
]
2
Michiko Inoue
[
1
]
3
Satoshi Ohtake
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
