2006 | ||
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2 | EE | Shin Yokoyama, Yoshikazu Nakane, Osamu Takahashi, Eiichi Miyamoto: Evaluation of the Impact of Selfish Nodes in Ad Hoc Networks and Detection and Countermeasure Methods. MDM 2006: 95 |
2002 | ||
1 | EE | Anri Nakajima, Quazi D. M. Khosru, Takashi Yoshimoto, Shin Yokoyama: Atomic-layer-deposited silicon-nitride/SiO2 stack--a highly potential gate dielectrics for advanced CMOS technology. Microelectronics Reliability 42(12): 1823-1835 (2002) |
1 | Quazi D. M. Khosru | [1] |
2 | Eiichi Miyamoto | [2] |
3 | Anri Nakajima | [1] |
4 | Yoshikazu Nakane | [2] |
5 | Osamu Takahashi | [2] |
6 | Takashi Yoshimoto | [1] |