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Zhang Yibin

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2004
1EEGuo Lihui, Zhang Yibin, Su Yong Jie Jeffrey: Integrating thick copper/Black DiamondTM layer in CMOS interconnect process for RF passive components. Microelectronics Reliability 44(4): 581-585 (2004)

Coauthor Index

1Su Yong Jie Jeffrey [1]
2Guo Lihui [1]

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