Su Yong Jie Jeffrey
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2004
1
EE
Guo Lihui
,
Zhang Yibin
, Su Yong Jie Jeffrey: Integrating thick copper/Black Diamond
TM
layer in CMOS interconnect process for RF passive components.
Microelectronics Reliability 44
(4): 581-585 (2004)
Coauthor
Index
1
Guo Lihui
[
1
]
2
Zhang Yibin
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)