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Shuangyan Xu

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2002
2EEXingsheng Liu, Shuangyan Xu, Guo-Quan Lu, David A. Dillard: Effect of substrate flexibility on solder joint reliability. Microelectronics Reliability 42(12): 1883-1891 (2002)
2001
1EEXingsheng Liu, Shuangyan Xu, Guo-Quan Lu, David A. Dillard: Stacked solder bumping technology for improved solder joint reliability. Microelectronics Reliability 41(12): 1979-1992 (2001)

Coauthor Index

1David A. Dillard [1] [2]
2Xingsheng Liu [1] [2]
3Guo-Quan Lu [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)