H. Wurzer
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2001
1
EE
T. Pompl
,
C. Engel
, H. Wurzer,
M. Kerber
: Soft breakdown and hard breakdown in ultra-thin oxides.
Microelectronics Reliability 41
(4): 543-551 (2001)
Coauthor
Index
1
C. Engel
[
1
]
2
M. Kerber
[
1
]
3
T. Pompl
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
